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Updated: May 31, 2026

07:15
A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Electric-field-driven nano-oxidation trimming of silicon microrings and interferometers
Yiran Shen1, Ivan B Divliansky, Dimitri N Basov
1University of California, San Diego, Mail Code 0407, La Jolla, California 92093, USA. yis004@ucsd.edu
Optics Letters
|July 19, 2011
Abstract:
Nanoscale disorder results in severe spectral misalignment of silicon microring resonators and Mach-Zehnder interferometers. We correct for such effects using electric-field-induced waveguide nano-oxidation, demonstrating a tuning wavelength range of several nanometers and 0.002 nm resolution without line shape degradation. Field-induced nano-oxidation is a permanent and precise technique and requires no new materials or high-temperature processing.

