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Effect of smear layer characteristics on dentin bonding durability of HEMA-free and HEMA-containing one-step
Yuko Shinoda1, Masatoshi Nakajima, Keiichi Hosaka
1Cariology and Operative Dentistry, Department of Restorative Sciences, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University.
Abstract:
The purpose of this study was to evaluate the effect of smear layer characteristics on the dentin bonding durability of HEMA-free and HEMA-containing one-step self-etch adhesives. Xeno V (XV; HEMA-free), G BOND PLUS (GB; HEMA-free) and Clearfil S(3 )Bond (S(3); HEMA-containing), were applied to dentin surfaces prepared with either #180- or #600-grit SiC paper according to manufacturers' instructions. Bond strengths to dentin were determined using µTBS test after 24-hour, 6-month, and 1-year water storage. In addition, nanoleakage evaluation was performed using an SEM. The smear layer characteristics affected water-tree nanoleakage formation in the adhesive layers of XV and GB, which contributed to a reduction in µTBS after 6-month water storage, while the characteristics did not affect the µTBS of S(3). However, regardless of the smear layer characteristics, 1-year water storage significantly reduced the µTBS of all the adhesives and was associated with an increase in failures at the adhesive-composite interface.
