Related Experiment Video

Updated: May 30, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Contrast inversion in electrostatic force microscopy imaging of trapped charges: tip-sample distance and dielectric

C Riedel1, A Alegría, R Arinero

  • 1Departamento de Física de Materiales UPV/EHU, Facultad de Química, Apartado 1072, 20080 San Sebastián, Spain. riedel@ies.univ-montp2.fr

Nanotechnology
|July 29, 2011
PubMed

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