Thermal conductivity measurements using 1ω and 3ω methods revisited for voltage-driven setups

Area of Science:

• Materials Science
• Condensed Matter Physics
• Nanotechnology

Background:

• The 1-omega (1ω) and 3-omega (3ω) methods are standard transient techniques for thermal transport analysis in various materials.
• These techniques rely on heater resistance changes due to Joule heating from a sinusoidal current.
• Existing formalisms often assume ideal current sources, creating ambiguity for voltage-driven setups.

Purpose of the Study:

• To clarify the necessity of corrections in analyzing transient thermal transport data from voltage-driven setups.
• To provide a definitive answer regarding data analysis for 1ω and 3ω methods under non-ideal source conditions.

Main Methods:

• Fourier analysis was employed to rigorously analyze the measurement data.
• The study focused on theoretical validation and experimental verification.

Main Results:

• Fourier analysis confirms that corrections are not required for 1ω methods.
• It is also shown that corrections are unnecessary for 3ω measurements employing common-mode subtraction.
• Experimental validation was performed on a fused silica substrate and a 150 nm nickel wire.

Conclusions:

• The findings eliminate ambiguity in data analysis for voltage-driven transient thermal transport measurements.
• This work simplifies the application of 1ω and 3ω methods, enhancing their reliability in materials characterization.