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Related Experiment Video

Updated: May 30, 2026

Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide

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Published on: May 23, 2025

Voltage-pulse-induced electromigration.

Toshiaki Hayashi¹, Toshimasa Fujisawa

¹NTT Basic Research Laboratories, NTT Corporation, 3-1, Morinosato-Wakamiya, Atsugi, Kanagawa 243-0198, Japan.

|August 6, 2011

Summary

This summary is machine-generated.

We developed a new technique using short voltage pulses to control electromigration in gold nanowires. This method allows precise manipulation of atomic movement for nanotechnology applications.

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Published on: November 19, 2009

Area of Science:

Materials Science
Nanotechnology
Physics

Background:

Electromigration is a critical phenomenon in nanoscale devices, affecting their reliability.
Controlling electromigration at the atomic level is essential for advanced nanotechnology.

Purpose of the Study:

To introduce and validate a novel voltage-pulse-induced electromigration technique.
To demonstrate precise control over electromigration in gold nanowires using short voltage pulses.

Main Methods:

Inducing electromigration in gold nanowires with brief (approx. 10 µs) voltage pulses.
Conducting local temperature analysis and controlled electromigration experiments under pulsed voltage.
Measuring current-voltage characteristics post-pulsing to study electromigration's stochastic nature.

Main Results:

Successfully demonstrated voltage-pulse-induced electromigration in gold nanowires.
Confirmed precise control over the electromigration process via pulsed voltage application.
Observed stochastic behavior of electromigration through current-voltage measurements.

Conclusions:

Voltage-pulse-induced electromigration offers a new method for controlling atomic transport in nanowires.
Pulse durations below thermal relaxation time enable independent control of temperature and driving force.
This technique holds potential for advanced nanoscale device fabrication and manipulation.