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Updated: May 30, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Development of a novel aptamer-based sensing system using atomic force microscopy
Yusuke Miyachi1, Chiaki Ogino, Tomokazu Amino
1Department of Chemical Science and Engineering, Faculty of Engineering, Graduate School of Engineering, Kobe University, Rokkoudai-chou 1-1, Nada, Kobe 657-8501, Japan.
Abstract:
Atomic force microscopy (AFM) can dynamically detect the adhesion or affinity force between a sample surface and a cantilever. This feature is useful as a detection method using aptamers--single-strand DNA that recognizes its target with very high affinity. The present study proposes a novel DNA aptamer-based sensing system using AFM. In this study, thrombin was chosen as the target molecule, and a DNA aptamer-based AFM sensing system based on competition was developed. The affinity force between the gold chip and the cantilever decreased as the concentration of thrombin increased. Moreover, a low detection limit of 0.2 nM was achieved. Therefore, the AFM sensing system used would be appropriate for the measurement of various chemical compounds.

