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On the difficulties in characterizing ZnO nanowires
E Schlenker1, A Bakin, T Weimann
1Institute of Semiconductor Technology, Technical University Braunschweig, Hans-Sommer-Straße 66, D-38106 Braunschweig, Germany.
Nanotechnology
|August 11, 2011
Summary
Electrical properties of zinc oxide (ZnO) nanowires vary widely. This study investigates factors causing these differences, comparing new measurements with existing literature data on ZnO nanowire resistivity.
Area of Science:
- Materials Science
- Nanotechnology
- Solid State Physics
Background:
- Zinc oxide (ZnO) nanowires are promising nanomaterials with diverse electronic applications.
- Previous studies report highly variable electrical resistivity in ZnO nanowires, hindering reliable application development.
- Understanding the sources of this variability is crucial for controlling ZnO nanowire properties.
Purpose of the Study:
- To investigate the electrical properties of single ZnO nanowires.
- To compare measured resistivities with existing literature data.
- To identify key factors contributing to the wide discrepancies in reported ZnO nanowire resistivities.
Main Methods:
- ZnO nanowires synthesized via vapor phase transport.
- Electrical resistivity measurements using Ti/Au electrodes and manipulator tip in a low energy electron point-source microscope.
- Comparative analysis of own data with published results.
Main Results:
- Measured resistivities for individual ZnO nanowires ranged from 1 to 10^3 Ωcm.
- Literature data showed a broader resistivity range from 10^-3 to 10^5 Ωcm.
- Significant discrepancies in resistivity values were observed across different studies.
Conclusions:
- Growth parameters, measurement techniques, contact resistance, crystal structure, and ambient conditions significantly influence ZnO nanowire resistivity.
- Further research is needed to standardize measurement protocols and understand the impact of each factor.
- Addressing these factors is essential for reproducible and predictable ZnO nanowire-based electronic devices.

