Ballistic electron emission spectroscopy on Ag/Si devices

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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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A Bannani1, C A Bobisch, M Matena

  • 1Department of Physics, Center for Nanointegration Duisburg-Essen, University of Duisburg-Essen, 47048 Duisburg, Germany.

Nanotechnology
|August 12, 2011
PubMed

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