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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 30, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Published on: October 24, 2014

High-resolution and large dynamic range nanomechanical mapping in tapping-mode atomic force microscopy.

Ozgur Sahin¹, Natalia Erina

¹The Rowland Institute at Harvard, Harvard University, Cambridge, MA 02142, USA.

|August 12, 2011

Summary

This summary is machine-generated.

New torsional harmonic cantilevers enable real-time measurement of tip-sample forces in atomic force microscopy. This allows simultaneous high-resolution mapping of material properties like elastic modulus and adhesion for nanomaterials and biological systems.

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Atomic Force Microscopy (AFM) is crucial for high-resolution imaging.
Tapping-mode AFM measures tip-sample interactions, providing insights into material properties.
Characterizing heterogeneous materials at the nanoscale requires advanced imaging techniques.

Purpose of the Study:

To report real-time measurement and analysis of time-varying tip-sample interaction forces using torsional harmonic cantilevers.
To demonstrate simultaneous high-resolution mapping of multiple material properties.
To showcase the capability of the technique for analyzing complex nanomaterials.

Main Methods:

Utilized recently introduced torsional harmonic cantilevers for atomic force microscopy.
Performed real-time measurement and analysis of time-varying tip-sample interaction forces.
Generated simultaneous high-resolution maps of elastic modulus, adhesion force, energy dissipation, and topography in a single scan.

Main Results:

Achieved high-resolution mapping of material properties with peak tapping forces as low as 0.6 nN.
Demonstrated measurements on blended polymers and self-assembled molecular architectures with feature sizes down to 1 nm.
Observed a four-orders-of-magnitude elastic modulus measurement range (1 MPa to 10 GPa) for a single cantilever.

Conclusions:

Torsional harmonic cantilevers enable simultaneous, high-resolution mapping of topography and multiple material properties.
The technique is effective for analyzing heterogeneous samples with diverse material components.
This advancement facilitates the development of nanomaterials and the study of biological systems.