Atomic Force Microscopy
Machines: Problem Solving II
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 30, 2026

Fabrication and Implementation of a Reference-Free Traction Force Microscopy Platform
Published on: October 6, 2019
Guillaume Michal1, Cheng Lu, A Kiet Tieu
1School of Mechanical, Materials and Mechatronic Engineering, University of Wollongong, Wollongong, 2500 NSW, Australia.
This study models lateral force microscope measurements, relating photodiode signals to tip apex forces. It analyzes optical system interactions and crosstalk effects on measurements.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: