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Development of a variable launch attenuation and isolation measurement system for optical waveguides.

David Ives¹, Robert Ferguson, Subrena Harris

¹National Physical Laboratory, Teddington, Middlesex, UK.

|August 12, 2011

Summary

A new system measures optical waveguide attenuation and isolation under varied launch conditions. This enables precise characterization for real-world board applications.

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Area of Science:

Photonics and Optical Engineering
Materials Science

Background:

Optical waveguides are crucial components in integrated photonics.
Accurate characterization of waveguide performance, including attenuation and isolation, is essential for device reliability and efficiency.
Existing measurement systems may lack the flexibility to simulate diverse operating conditions.

Purpose of the Study:

To present a novel system for measuring optical waveguide attenuation and isolation.
To enable exploration of waveguide properties under a range of reproducible launch conditions.
To correlate system measurements with actual board operating conditions.

Main Methods:

The developed system allows for variable control of launch signal spot size and numerical aperture.
Characterization of the optical system includes magnification factor, linearity, sensitivity, and charge-coupled device (CCD) camera uniformity.

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Measurements were performed on various waveguide designs, including planar, radii, and crossover structures.

Main Results:

The system successfully measures attenuation and isolation of optical waveguides.
Initial results for different waveguide designs are presented.
Key uncertainty contributions of the measurement system have been assessed.

Conclusions:

The described system provides a versatile platform for characterizing optical waveguides.
The ability to control and correlate launch conditions enhances the practical applicability of the measurements.
The uncertainty analysis provides a foundation for reliable performance assessment of optical waveguide devices.