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Updated: May 30, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

All-fiber interferometry: design and analysis.

Abhijit A Kulkarni¹, Shanti Bhattacharya, Anil Prabhakar

¹J F Welch Technology Center, Bangalore, India.

|August 12, 2011

Summary

This summary is machine-generated.

This study details an inexpensive, compact fiber interferometer for precise height measurements. Optimized electronics and a two-stage design enable nanometer to micrometer range measurements with high accuracy.

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Area of Science:

Optoelectronics
Metrology
Instrumentation Engineering

Background:

Fiber interferometers are crucial for precise measurements.
Existing systems can be complex and costly.
Need for compact, accurate, and cost-effective interferometric solutions.

Purpose of the Study:

To present a design for an optimized fiber interferometer.
To develop an inexpensive and compact optical and electronic system.
To achieve accurate height measurements across multiple scales.

Main Methods:

Designed a fiber interferometer with a two-stage measurement approach.
Optimized analog and digital circuits for cost and size reduction.
Utilized a field-programmable gate array (FPGA) for lock-in amplification and phase stepping.
Employed a least squares method for efficient and accurate height determination.

Main Results:

Developed a compact and inexpensive fiber interferometer system.
First stage measures step heights in the hundreds of nanometers using one wavelength.
Second stage extends the measurement range to hundreds of micrometers using two wavelengths.
System demonstrates improved accuracy through data averaging and a least squares method.

Conclusions:

The designed fiber interferometer offers a cost-effective and compact solution for precise height measurements.
The two-stage design effectively extends the measurement range.
The optimized electronic control ensures high accuracy and efficiency.