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Updated: May 30, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
1School of Mechanical & Aerospace Engineering, Nanyang Technological University, Singapore.
This study introduces a novel diffraction grating interferometer for precise, long-stroke displacement sensing. The innovative design achieves nanometer resolution, enhancing linear stage measurement accuracy.
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