Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Propagation of Uncertainty from Random Error00:59

Propagation of Uncertainty from Random Error

An experiment often consists of more than a single step. In this case, measurements at each step give rise to uncertainty. Because the measurements occur in successive steps, the uncertainty in one step necessarily contributes to that in the subsequent step. As we perform statistical analysis on these types of experiments, we must learn to account for the propagation of uncertainty from one step to the next. The propagation of uncertainty depends on the type of arithmetic operation performed on...
Propagation of Uncertainty from Systematic Error01:10

Propagation of Uncertainty from Systematic Error

The atomic mass of an element varies due to the relative ratio of its isotopes. A sample's relative proportion of oxygen isotopes influences its average atomic mass. For instance, if we were to measure the atomic mass of oxygen from a sample, the mass would be a weighted average of the isotopic masses of oxygen in that sample. Since a single sample is not likely to perfectly reflect the true atomic mass of oxygen for all the molecules of oxygen on Earth, the mass we obtain from this particular...
Distribution Reliability and Automation01:25

Distribution Reliability and Automation

Distribution reliability in electrical power systems is critical for ensuring an uninterrupted power supply to consumers at minimal cost. According to IEEE Standard Terms, reliability is the probability that a device will function without failure over a specified time period or amount of usage. For electric power distribution, this translates to maintaining continuous power supply and addressing customer concerns over power outages. Several indices, as defined by IEEE Standard 1366-2012, are...
Types of Errors: Detection and Minimization01:12

Types of Errors: Detection and Minimization

Error is the deviation of the obtained result from the true, expected value or the estimated central value. Errors are expressed in absolute or relative terms.
Absolute error in a measurement is the numerical difference from the true or central value. Relative error is the ratio between absolute error and the true or central value, expressed as a percentage.
Errors can be classified by source, magnitude, and sign. There are three types of errors: systematic, random, and gross.
Systematic or...
Mismatch Repair01:20

Mismatch Repair

Organisms are capable of detecting and fixing nucleotide mismatches that occur during DNA replication. This sophisticated process requires identifying the new strand and replacing the erroneous bases with correct nucleotides. Mismatch repair is coordinated by many proteins in both prokaryotes and eukaryotes.
The Mutator Protein Family Plays a Key Role in DNA Mismatch Repair
The human genome has more than 3 billion base pairs of DNA per cell. Prior to cell division, that vast amount of genetic...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Improved Quantification of Circulating Tumor DNA in Translocation-Associated Myxoid Liposarcoma by Simultaneous Detection of Breakpoints and Single Nucleotide Variants.

Cancer medicine·2025
Same author

[Complete regression of a choroidal metastasis from melanoma with dual targeted therapy].

Journal francais d'ophtalmologie·2023
Same author

Non-surgical external jugular vein catheterization using an ear vein access in piglets.

Laboratory animals·2023
Same author

Noise-optimized virtual monoenergetic reconstructions of dual-energy CT angiographies improve assessability of the lower leg arterial segments in peripheral arterial occlusive disease.

Radiography (London, England : 1995)·2022
Same author

T2-weighted MRI defines critical compression in the distal carpal tunnel that is relieved after decompressive surgery.

Journal of plastic, reconstructive & aesthetic surgery : JPRAS·2022
Same author

Targeted next-generation sequencing of circulating free DNA enables non-invasive tumor detection in myxoid liposarcomas.

Molecular cancer·2022

Related Experiment Video

Updated: May 30, 2026

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

Optimization of nanoelectronic systems' reliability under massive defect density using cascaded R-fold modular

M Stanisavljevic1, A Schmid, Y Leblebici

  • 1Microelectronic Systems Laboratory (LSM), Swiss Federal Institute of Technology (EPFL), CH-1015 Lausanne, Switzerland.

Nanotechnology
|August 13, 2011
PubMed
Summary
This summary is machine-generated.

This study compares fault-tolerant techniques like R-fold modular redundancy for large-scale systems. Optimal application windows are identified to balance reliability with power and area costs in nanoscale technologies.

More Related Videos

A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals
09:58

A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals

Published on: May 10, 2018

Related Experiment Videos

Last Updated: May 30, 2026

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals
09:58

A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals

Published on: May 10, 2018

Area of Science:

  • Electrical Engineering
  • Computer Architecture
  • Nanotechnology

Background:

  • Future nanoscale technologies face challenges with high defect densities.
  • Fault-tolerant techniques are crucial for building reliable large-scale systems.
  • Existing techniques require optimization for massive defect levels.

Purpose of the Study:

  • To theoretically analyze and compare R-fold modular redundancy, cascaded R-fold modular redundancy, and NAND multiplexing.
  • To perform optimal cluster size and redundancy analysis for cascaded R-fold modular redundancy in large-scale systems.
  • To determine the optimal application window for each technique based on defect density for reliability and power/area trade-offs.

Main Methods:

  • Theoretical analysis of fault-tolerant techniques.
  • Comparative analysis based on resistance to massive defect densities.
  • Optimization of cluster size and redundancy for cascaded R-fold modular redundancy.
  • Analysis of design trade-offs between reliability, power, and area.

Main Results:

  • Comparison of fault-tolerant techniques under high defect density conditions.
  • First-time optimal cluster size and redundancy analysis for cascaded R-fold modular redundancy in large-scale systems.
  • Identification of optimal application windows for each technique relative to defect density.
  • Demonstration that high power/area costs are inherent to future nanoscale systems with high defect densities.

Conclusions:

  • Fault-tolerant techniques offer varying degrees of resistance to massive defect densities.
  • Optimizing R-fold modular redundancy is key for large-scale systems in high-defect environments.
  • Design choices involve trade-offs between system reliability and resource consumption (power/area).
  • Significant power and area costs are unavoidable in future nanoscale systems with high defect densities, irrespective of the fault-tolerant strategy.