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Updated: May 30, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Modelling and analysis of autonomous micro-cantilever oscillations
M Basso1, P Paoletti, B Tiribilli
1Dipartimento di Sistemi e Informatica, Università di Firenze, via Santa Marta 3, I-50139, Firenze, Italy. CSDC, Via Sansone 1, I-50019, Sesto Fiorentino, Firenze, Italy.
Abstract:
Tapping mode atomic force microscopy provides good resolution in imaging applications, but it still requires a time-consuming initial configuration and features quite low scanning velocity. In this paper we present a new dynamic mode in which the cantilever gets excited by a feedback loop containing a saturation function. The proposed scheme is then analysed in the frequency domain and simulated against the standard set-up, showing good performance and elimination of some of the known drawbacks. Preliminary results in experiments confirm the effectiveness of this operating mode.
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