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Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
Luis A Miccio1, Mohammed M Kummali, Pablo E Montemartini
1Institute of Materials Science and Technology (INTEMA), University of Mar del Plata and National Research Council (CONICET), JB. Justo 4302, Mar del Plata, Buenos Aires, Argentina. luisalejandro_miccio@ehu.es
Abstract:
By means of electric force microscopy, composition depth profiles were measured with nanometric resolution for a series of fluorinated networks. By mapping the dielectric permittivity along a line going from the surface to the bulk, we were able to experimentally access to the fluorine concentration profile. Obtained data show composition gradient lengths ranging from 30 nm to 80 nm in the near surface area for samples containing from 0.5 to 5 wt. % F, respectively. In contrast, no gradients of concentration were detected in bulk. This method has several advantages over other techniques because it allows profiling directly on a sectional cut of the sample. By combining the obtained results with x-ray photoelectron spectroscopy measurements, we were also able to quantify F/C ratio as a function of depth with nanoscale resolution.
