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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Published on: June 19, 2018

Atomic resolution imaging using the real-space distribution of electrons scattered by a crystalline material

Sorin Lazar1, Joanne Etheridge, Christian Dwyer

  • 1FEI Electron Optics, Achtseweg Noord 5, Eindhoven, 5600 KA, The Netherlands. sorin.lazar@fei.com

Acta Crystallographica. Section A, Foundations of Crystallography
|August 17, 2011
PubMed

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