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[Boundary threshold value method used in crystalline material internal defect detection by short wavelength X-ray

Jian-Lei Mu1, Jin Zhang, Zheng-Huan Gao

  • 1Beijing Key Laboratory for Corrosion, Erosion and Surface Technology, University of Science and Technology Beijing, Beijing 100083, China. mujianlei725@126.com

Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
|August 19, 2011
PubMed
Summary

This study introduces a thresholding method for X-ray diffraction tomography using a short wavelength X-ray diffractometer (SWXRD) to clearly detect crystalline material defects. The method effectively determines defect boundaries, enhancing imaging quality for internal defect analysis.

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