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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Aldo D Pezzutti1, Daniel A Vega
1Department of Physics and Instituto de Física del Sur, Universidad Nacional del Sur-CONICET, Av LN Além 1253, 8000 Bahía Blanca, Argentina.
Defect annihilation dynamics in flexible membranes are slowed by energetic asymmetry between positive and negative disclinations. This impacts equilibrium properties and defect interactions, deviating from flat system dynamics.
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