Two new edge detectors

C J Jacobus1, R T Chien

  • 1Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801; Texas Instruments, Inc., Dallas, TX 75265.

Summary

This paper presents two novel edge detection algorithms for image processing. One method uses multiple difference detectors, while the other employs three-state images and masks for improved contour extraction.

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