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From Voxels to Knowledge: A Practical Guide to the Segmentation of Complex Electron Microscopy 3D-Data
Published on: August 13, 2014
1Department of Mathematics and Computer Science, James Madison University, Harrisonburg, VA 22807.
This study introduces "internal concavity," a novel signed distance metric for Voronoi diagrams of dot patterns. This metric enables a new algorithm for segmenting dot patterns and their associated Delaunay triangulations.
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