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Terahertz Imaging and Characterization Protocol for Freshly Excised Breast Cancer Tumors

Terahertz Imaging and Characterization Protocol for Freshly Excised Breast Cancer Tumors

Published on: April 5, 2020

Self-referenced method for terahertz wave time-domain spectroscopy.

Albert Redo-Sanchez¹, Xi-Cheng Zhang

¹Rensselaer Polytechnic Institute, Troy, New York 12180, USA.

|September 3, 2011

Summary

This summary is machine-generated.

This study introduces a self-referenced terahertz spectroscopy method to measure sample absorbance without a reference. It achieves high-resolution frequency by dynamically adjusting resolution and removing echo effects.

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Last Updated: Jan 11, 2026

Terahertz Imaging and Characterization Protocol for Freshly Excised Breast Cancer Tumors

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Published on: April 5, 2020

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity

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Terahertz Microfluidic Sensing Using a Parallel-plate Waveguide Sensor

Terahertz Microfluidic Sensing Using a Parallel-plate Waveguide Sensor

Published on: August 30, 2012

Area of Science:

Spectroscopy
Optics and Photonics
Materials Science

Background:

Terahertz (THz) time-domain spectroscopy (TDS) typically requires a reference measurement to determine sample absorbance.
Achieving high frequency resolution in THz-TDS is often limited by the temporal window length and the presence of echoes.

Purpose of the Study:

To develop a self-referenced method for retrieving sample absorbance in THz-TDS.
To enhance frequency resolution by overcoming limitations of temporal window length and echo interference.

Main Methods:

Measuring dynamic frequency resolution variation during waveform acquisition.
Extracting self-referenced absorbance by determining dynamic reference and peak values.
Implementing an echo removal mechanism for arbitrary temporal window selection.

Main Results:

Successful retrieval of absorbance without a reference measurement.
Demonstrated high-resolution frequency analysis.
Validated the method for water vapor lines and gas/semiconductor resonant features in transmission and reflection.

Conclusions:

The developed self-referenced THz-TDS method eliminates the need for external references.
The technique significantly improves frequency resolution and echo suppression.
Applicable to diverse materials and measurement geometries for detailed spectral analysis.