High resolution extreme ultraviolet spectrometer for an electron beam ion trap

Hayato Ohashi1, Junji Yatsurugi, Hiroyuki A Sakaue

  • 1Institute for Laser Science, The University of Electro-Communications, Chofu, Tokyo, Japan. h_ohashi@ils.uec.ac.jp

Summary

A new extreme ultraviolet spectrometer was developed for studying highly charged ions using an electron beam ion trap. This high-performance instrument achieves a resolving power exceeding 1000 for detailed spectroscopic analysis.

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