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Transmission Electron Microscopy

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...

Overview of Electron Microscopy

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

Electron Microscope Tomography and Single-particle Reconstruction

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

Overview of Microscopy Techniques

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 29, 2026

Stereocilia Bundle Imaging with Nanoscale Resolution in Live Mammalian Auditory Hair Cells

Stereocilia Bundle Imaging with Nanoscale Resolution in Live Mammalian Auditory Hair Cells

Published on: January 21, 2021

A piezoelectric goniometer inside a transmission electron microscope goniometer.

Wei Guan¹, Aiden Lockwood, Beverley J Inkson

¹NanoLAB Centre, Department of Materials Science and Engineering, University of Sheffield, Sheffield S1 3JD, UK.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

|September 14, 2011

Summary

A new piezoelectric nanomanipulation system offers precise control for transmission electron microscopy (TEM). This advanced goniometric system provides seven degrees of freedom for enhanced in situ experiments.

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Published on: September 28, 2015

Area of Science:

Materials Science
Nanotechnology
Microscopy

Background:

Piezoelectric nanoactuators are crucial for stable positioning in transmission electron microscopy (TEM).
Existing systems require further miniaturization and integration for advanced in situ applications.

Purpose of the Study:

To develop and demonstrate a second-generation, fully piezo-actuated goniometric nanomanipulation system for TEM.
To enhance in situ experimental capabilities within a transmission electron microscope.

Main Methods:

Integration of a miniature goniometric system with seven degrees of freedom (3 fine translation, 3 coarse translation, 1 rotation) into a standard TEM specimen holder.
Utilizing piezoelectric actuators for ultrafine step size translation and rotation with absolute angular feedback.
Independent operation of the nanomanipulator within the existing TEM goniometer.

Main Results:

The system offers precise, programmable control with seven degrees of freedom for sample manipulation inside a TEM.
Demonstrated in situ capabilities include tomographic tilt without missing wedge and differential tilt between specimens.
The miniaturized design allows seamless integration into standard TEM specimen holders.

Conclusions:

The developed piezoelectric nanomanipulation system significantly advances in situ capabilities in transmission electron microscopy.
This technology enables more complex and precise experiments, such as advanced tomography and comparative sample analysis.
The system's integration and performance highlight the potential of piezoelectric actuators for next-generation electron microscopy tools.