X-ray Crystallography
IR Spectrometers
Determination of Crystal Structures
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 29, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
P Modregger1, B R Pinzer, T Thüring
1Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland. peter.modregger@psi.ch
This study presents a numerical framework to quantify X-ray phase-contrast grating interferometry sensitivity. It identifies optimal parameters for enhancing sensitivity in synchrotron setups.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: