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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Ab initio study of isolated chlorine defects in cubic SiC

G Alfieri1, T Kimoto

  • 1Department of Electronic Science and Engineering, Kyoto University, Kyotodaigaku-katsura, Nishikyo, Kyoto 615-8510, Japan. giovanni@semicon.kuee.kyoto-u.ac.jp

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|October 1, 2011
PubMed

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