Application of differential charging in XPS for structural study of Langmuir-Blodgett films

Differential charging in XPS was recently shown to be a novel technique for studying in-depth structural information of discrete cadmium layers in Langmuir-Blodgett (LB) multilayer films. Here we report structural modification in multilayer LB films after sulfidation using differential charging in angle-dependent XPS that are not observable by the x-ray reflectivity technique. An AFM study suggests less modification in compact LB films in comparison to the non-compact ones. The differential charging in the LB multilayers changes after sulfidation due to the formation of cadmium sulfide nanostructures in the cadmium arachidate LB matrix, which was reflected prominently in the differential charging of Cd 3d(5/2) XPS peaks. It was found that, even after sulfidation, the compact multilayer LB films were differentially charged in the out-of-plane (in-depth) direction, whereas this kind of differential charging was not apparent in rough and non-compact films. Our results clearly indicate that for LB films with compact structure a partial layered structure survives the impact of particle formation, whereas for non-compact films the modification is large and no specific conclusion could be drawn. While x-ray reflectivity cannot provide specific information about the internal structure of the post-sulfidation films it shows that the total thickness of the films reduces in all cases.