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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Nicola Calabretta1, Ripalta Stabile, Aaron Albores-Mejia
1COBRA Research Institute, Eindhoven University of Technology, P. O. Box 513, NL-5600 Eindhoven, The Netherlands. n.calabretta@tue.nl
This study introduces an Indium Phosphide (InP) chip for wavelength selection, using a binary search to efficiently choose from multiple modulated wavelengths with fast, error-free performance.
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