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Updated: May 28, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
In situ observation of morphological change in CdTe nano- and submicron wires
Keivan Davami1, Hessam M Ghassemi, Xuhui Sun
1Division of IT Convergence Engineering, Pohang University of Science and Technology, Pohang, Republic of Korea.
Abstract:
We report growth and characterization of CdTe wires 30–400 nm in diameter by the vapor–liquid–solid technique. Individual nanowires were placed on a movable piezotube, which allowed three-dimensional motion toward a scanning tunneling microscope (STM). A bias was applied to the STM tip in contact with the nanowire, and the morphological changes due to Joule heating were observed in situ using a transmission electron microscope (TEM) in real time. For thick CdTe wires (d > ~150 nm), the process results in the growth of superfine nanowires (SFNWs) of 2–4 nm diameter on the surface of the wire. Smaller diameter nanowires, in contrast, disintegrate under the applied bias before the complete evolution of SFNWs on the surface.

