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Excitation-Scanning Hyperspectral Imaging Microscopy to Efficiently Discriminate Fluorescence Signals
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Scanning electron microscope image enhancement using spread spectrum through dither signal imposition

Kwang Oh Jung1, Wonjong Joo, Dong Hwan Kim

  • 1Graduate School of NID Fusion Technology, Seoul National University of Science and Technology, Seoul 139-743, South Korea.

Journal of Electron Microscopy
|October 13, 2011
PubMed

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