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Design, Fabrication, and Experimental Characterization of Plasmonic Photoconductive Terahertz Emitters

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Simulation of complex plasmonic circuits including bends.

Claudio Dellagiacoma¹, Theo Lasser, Olivier J F Martin

¹Institut de Microtechnique, Swiss Federal Institute of Technology Lausanne (EPFL), 1015 Lausanne, Switzerland.

|October 15, 2011

Summary

This summary is machine-generated.

We developed a flexible finite-element method to simulate plasmonic and dielectric waveguides. This approach analyzes integrated plasmonic circuits and their insertion losses.

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Area of Science:

Optics and Photonics
Materials Science
Computational Electromagnetics

Background:

Plasmonic and dielectric waveguides are crucial for integrated photonic circuits.
Analyzing mode coupling and insertion losses in complex waveguide structures is challenging.

Purpose of the Study:

To present a flexible finite-element, full-wave modeling method for analyzing dielectric and plasmonic waveguides.
To simulate mode coupling in integrated plasmonic circuits.
To evaluate the performance, specifically insertion losses, of these circuits.

Main Methods:

Utilized a finite-element, full-wave modeling approach.
Applied the method to simulate an integrated plasmonic circuit.
Modeled coupling between straight dielectric and hybrid long-range plasmon waveguides, including a uniformly bent section.

Main Results:

Demonstrated a flexible method for analyzing waveguide structures and mode coupling.
Simulated an integrated plasmonic circuit with hybrid waveguides.
Discussed the insertion losses associated with the simulated plasmonic circuit.

Conclusions:

The finite-element, full-wave method provides a versatile tool for simulating complex plasmonic and dielectric waveguide systems.
The study highlights the importance of analyzing insertion losses in the design of integrated plasmonic circuits.