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Updated: May 28, 2026

Use of Sacrificial Nanoparticles to Remove the Effects of Shot-noise in Contact Holes Fabricated by E-beam Lithography
Published on: February 12, 2017
1Imaging Systems Laboratory, Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong.
This study introduces pixelated source-mask optimization (SMO) to improve lithography resolution. By incorporating statistical variations, this method enhances process robustness for smaller circuit patterns.
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