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Updated: May 28, 2026

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
Published on: August 19, 2016
Free carrier accumulation during direct laser writing in chalcogenide glass by light filamentation
Ophélie Caulier1, David Le Coq, Laurent Calvez
1Laboratoire de Physico Chimie de l’Atmosphere, EA CNRS 4493, Universite du Littoral Cote d’Opale, 59140 Dunkerque, France.
Abstract:
We present direct laser writing of channels in chalcogenide glass under light filamentation conditions. Because of the intrinsic properties of the filament, the positive refractive index profile of the channels exhibits a cylindrical symmetry of high quality. The role of the repetition rate is also investigated. It is shown that if the time separation between pulses is shorter than the lifetime of the plasma, the free carriers accumulate and induce a larger variation of the refractive index.

