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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Electron Microscope Tomography and Single-particle Reconstruction01:07

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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Atom Probe Tomography Analysis of Exsolved Mineral Phases
08:14

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Published on: October 25, 2019

Atom probe trajectory mapping using experimental tip shape measurements.

D Haley1, T Petersen, S P Ringer

  • 1Department of Materials, University of Oxford, Oxford, U.K. daniel.haley@materials.ox.ac.uk

Journal of Microscopy
|October 19, 2011
PubMed
Summary
This summary is machine-generated.

This study introduces a novel reverse projection method to correct distortions in atom probe tomography (APT) data. The technique accurately maps ions back to the specimen surface, improving 3D reconstructions.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Computational Physics

Background:

  • Atom probe tomography (APT) offers high-resolution 3D reconstruction of material composition.
  • Global distortions in APT data arise from complex, variable projection functions.
  • Accurate characterization of these distortions is crucial for reliable analysis.

Purpose of the Study:

  • To develop and demonstrate a method for reverse projecting ions in APT.
  • To enable accurate mapping of detected ions back to the original specimen surface.
  • To correct for global distortions in 3D APT reconstructions.

Main Methods:

  • Combining transmission electron microscopy (TEM) tilt tomography with point cloud surface reconstruction.
  • Utilizing finite element modeling to generate a physically motivated mapping.
  • Applying numerical solutions to the electrostatic equation for reconstruction.

Main Results:

  • A general procedure for generating mappings between arbitrary surfaces and known tip shapes was established.
  • The method successfully mapped ions back to the original aluminum tip surface.
  • Quantitative solutions for the projection problem were achieved rapidly on a standard workstation.

Conclusions:

  • The developed reverse projection method effectively corrects global distortions in APT.
  • This technique enhances the accuracy and reliability of 3D material reconstructions.
  • The approach is broadly applicable to various APT experiments and specimen types.