Related Experiment Video
Updated: May 28, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Beilstein journal of nanotechnology
1Karlsruhe Institute of Technology (KIT), Institute of Applied Physics, 76128 Karlsruhe, Germany.
Beilstein Journal of Nanotechnology
|October 21, 2011
Summary
No abstract available in PubMed .

