The atomic force microscope as a mechano-electrochemical pen.

Christian Obermair1, Andreas Wagner, Thomas Schimmel

  • 1Institute of Applied Physics and Center for Functional Nanostructures (CFN), South Campus, Karlsruhe Institute of Technology (KIT), 76128 Karlsruhe, Germany.

Summary

This study introduces a novel mechano-electrochemical pen using an atomic force microscope (AFM) to precisely write metallic nanostructures without applied voltage. This method enables reproducible nanoscale patterning with controlled line widths for advanced materials applications.