Atomic Force Microscopy
Overview of Microscopy Techniques
Scanning Electron Microscopy
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 27, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
Futoshi Iwata1, Yuya Mizuguchi, Hideyuki Ko
1Department of Mechanical Engineering, Shizuoka University, Hamamatsu 432-8561, Japan. tmfiwat@ipc.shizuoka.ac.jp
We developed a compact nanomanipulator for scanning electron microscopes (SEM) enabling precise biological sample manipulation. This atomic force microscope (AFM)-based system allows nanodissection and imaging within the SEM, revealing hidden structures.
08:59High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
Published on: March 22, 2024
10:06Functionalization of Atomic Force Microscope Cantilevers with Single-T Cells or Single-Particle for Immunological Single-Cell Force Spectroscopy
Published on: July 10, 2019
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: