Elemental imaging at the nanoscale: NanoSIMS and complementary techniques for element localisation in plants

Katie L Moore1, Enzo Lombi, Fang-Jie Zhao

  • 1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. katie.moore@materials.ox.ac.uk

Summary

High-resolution secondary ion mass spectrometry (SIMS) precisely maps elemental distributions in plants at the subcellular level. This technique aids in understanding plant metabolism, mineral transport, and responses to elemental stress.