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Updated: May 27, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Interfacial properties of polystyrene thin films as revealed by neutron reflectivity
Rintaro Inoue1, Kazuko Kawashima, Kazuya Matsui
1Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611-0011, Japan. rintaro@scl.kyoto-u.ac.jp
Abstract:
We have studied the glass transition temperature (T(g)) and molecular mobility of polystyrene (PS) thin films near the interface between the polymer thin film and substrate with bilayer thin films consisting of surface hydrogenated PS (h-PS) and bottom deuterated PS (d-PS) using neutron reflectivity. With decreasing the thickness of the bottom d-PS layer, T(g) near the interface between the polymer thin film and substrate increased compared to bulk T(g) and a drastic increase of T(g) was observed for the bottom d-PS layer <155 Å thick. The orientation of polymer chains at the interface is supposed to be related to the increase of T(g) near the interface between the polymer and substrate. The polymer chain mobility decreased with thickness even for the bottom d-PS layer with no discernible change of T(g). It is considered that the numerous contacts between polymer chains and substrate are related to the decrease of mobility near the interface between the polymer thin film and substrate.
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