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Updated: May 27, 2026

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Targeted Studies Using Serial Block Face and Focused Ion Beam Scan Electron Microscopy
Published on: August 10, 2019
Gertrude Rempfer and the development of high resolution focused ion beam technology
1Department of Electrical and Computer Engineering, University of Maryland at College Park, P.O. Box 70, Rockaway Beach, OR 97136, USA. jon.orloff@mindspring.com
Ultramicroscopy
|November 15, 2011
Abstract:
High resolution focused ion beam (FIB) technology depends on electrostatic optics. As a longtime researcher on electrostatic optics Dr. Gertrude Rempfer has had a great impact not only on the development of FIB technology but, as a result, also on several technology areas dependent on it. This paper provides a brief description of how that came about.

