Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Targeting NK cell CLEC12B enhances cancer immunotherapy.

Nature immunology·2026
Same author

Niche environment remodeling promotes long-term endometrium stromal stem cell engraftment and tissue regeneration in thin endometrium.

Molecular therapy : the journal of the American Society of Gene Therapy·2025
Same author

Simulating the ionic liquid mixing with organic-solvent clarifies the mixture's SFG spectral behavior and the specific surface region originating SFG.

Scientific reports·2024
Same author

A compressive hyperspectral video imaging system using a single-pixel detector.

Nature communications·2024
Same author

Mechanism and treatment of olfactory dysfunction caused by coronavirus disease 2019.

Journal of translational medicine·2023
Same author

Sum frequency generation spectroscopy of fluorinated organic material-based interfaces: a tutorial review.

The Analyst·2023
Same journal

Anharmonic phonons via quantum thermal bath simulations.

The Journal of chemical physics·2026
Same journal

Quantum simulation of alignment dependent differential cross sections in co-propagating molecular beams at cold collision energies.

The Journal of chemical physics·2026
Same journal

Non-additive ion effects on the coil-globule equilibrium of a generic polymer in aqueous salt solutions.

The Journal of chemical physics·2026
Same journal

Insights into the unexpected small reduction of the temperature of maximum density of water by lithium chloride addition.

The Journal of chemical physics·2026
Same journal

Optical frequency comb double-resonance spectroscopy of the 9030-9175 cm-1 states of ethylene.

The Journal of chemical physics·2026
Same journal

Time reversal breaking of colloidal particles in cells.

The Journal of chemical physics·2026
See all related articles

Related Experiment Video

Updated: May 27, 2026

Lensless Fluorescent Microscopy on a Chip
11:23

Lensless Fluorescent Microscopy on a Chip

Published on: August 17, 2011

Sum frequency generation-compressive sensing microscope.

Xiaojun Cai1, Bian Hu, Ting Sun

  • 1Department of Chemistry, University of Houston, Texas 77024-5003, USA.

The Journal of Chemical Physics
|November 25, 2011
PubMed
Summary
This summary is machine-generated.

A new compressive sensing (CS) imaging microscope offers high-quality surface analysis by using fewer measurements. This novel technique achieves significantly higher pixel density than traditional methods for detailed surface studies.

More Related Videos

Generation and Coherent Control of Pulsed Quantum Frequency Combs
06:42

Generation and Coherent Control of Pulsed Quantum Frequency Combs

Published on: June 8, 2018

A Multimodal Wide-Field Fourier-Transform Raman Microscope
06:48

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Related Experiment Videos

Last Updated: May 27, 2026

Lensless Fluorescent Microscopy on a Chip
11:23

Lensless Fluorescent Microscopy on a Chip

Published on: August 17, 2011

Generation and Coherent Control of Pulsed Quantum Frequency Combs
06:42

Generation and Coherent Control of Pulsed Quantum Frequency Combs

Published on: June 8, 2018

A Multimodal Wide-Field Fourier-Transform Raman Microscope
06:48

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Area of Science:

  • Surface Science
  • Microscopy
  • Optical Imaging

Background:

  • Traditional surface analysis methods face limitations in resolution and signal detection.
  • Sum frequency generation (SFG) microscopy is a powerful technique for chemical identification of surfaces.
  • Compressive sensing (CS) offers a novel approach to image reconstruction with reduced data acquisition.

Purpose of the Study:

  • To develop and evaluate a novel sum frequency generation (SFG) imaging microscope utilizing compressive sensing (CS) for enhanced surface studies.
  • To compare the performance of CS-based SFG imaging with traditional raster scanning methods.
  • To investigate the impact of CS parameters on image quality and resolution.

Main Methods:

  • Development of a new SFG imaging microscope incorporating CS principles.
  • Application of pseudorandom patterns to a light modulator for SF signal detection.
  • Reconstruction of sample images using sparsity-preserving algorithms from acquired SF signals.
  • Comparative analysis of CS and raster scan imaging at varying resolutions on a gold-patterned Si surface.

Main Results:

  • The CS-based SFG microscope successfully reconstructed high-quality images with fewer measurements than conventional methods.
  • Image quality was investigated concerning the number of CS patterns and SF pulses per pattern.
  • The CS technique demonstrated a 16-fold increase in achievable pixel density compared to raster scanning.
  • CS imaging maintained sample imaging capability at resolutions where raster scanning failed due to signal dilution.

Conclusions:

  • Compressive sensing provides a significant advancement in SFG microscopy for surface analysis, enabling higher resolution and sensitivity.
  • The developed CS-SFG microscope overcomes limitations of traditional raster scanning, particularly for samples with weak SF signals.
  • This novel approach opens new possibilities for detailed nanoscale surface characterization.