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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: May 27, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Note: vibration reduction control of an atomic force microscope using an additional cantilever.

Chulsoo Kim¹, Jongkyu Jung, Kyihwan Park

¹ICE/EV Convergence Technology Research Center, Korea Automotive Technology Institute, 74 Yongjung-Ri, Pungse-Myun, Dongnam-Gu, Chonan-Si, Chungnam 330-912, Republic of Korea. cskim@katech.re.kr

The Review of Scientific Instruments

|December 2, 2011

Summary

This summary is machine-generated.

External vibration affects atomic force microscopy precision. Measuring and subtracting vibration using an additional sensor improves signal quality. Optimal sensor placement is crucial for effective vibration reduction control.

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

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Published on: December 20, 2016

Area of Science:

Physics
Materials Science
Instrumentation

Background:

Atomic Force Microscopes (AFM) require sub-nanometer precision.
External vibrations significantly impact AFM measurement accuracy.
Existing methods may not fully mitigate vibration noise.

Purpose of the Study:

To develop an effective vibration reduction strategy for AFMs.
To investigate the influence of additional sensor placement on vibration rejection.
To validate a novel electrical sensing method for vibration compensation.

Main Methods:

Utilizing an additional sensor to measure environmental vibrations.
Implementing a signal subtraction technique to remove vibration components.
Analyzing vibration phases to determine optimal sensor location.
Performing time domain analysis and imaging standard grid samples.

Main Results:

Demonstrated successful vibration reduction through signal subtraction.
Identified optimal sensor placement for maximizing vibration rejection ratio.
Verified the effectiveness of the electrical sensing method via experimental data.
Topology images showed improved sample surface detail after vibration control.

Conclusions:

Accurate vibration measurement and strategic sensor placement are key to high-performance AFM.
The proposed electrical sensing and subtraction method offers a viable solution for vibration compensation.
This technique enhances the reliability and precision of sub-nanometer measurements in AFMs.