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Reconstruction of Signal using Interpolation

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Phase extraction in speckle interferometry by a circle fitting procedure in the complex plane.

Sébastien Equis1, Patrick Flandrin, Pierre Jacquot

  • 1Swiss Federal Institute of Technology, Nanophotonics and Metrology Laboratory, 1015 Lausanne, Switzerland. sebastien.equis@epfl.ch

Optics Letters
|December 6, 2011
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Summary
This summary is machine-generated.

This study introduces a novel circle fitting method for speckle interferometry (SI) to accurately remove background noise from temporal signals. The new approach enhances the determination of instantaneous frequency, outperforming empirical mode decomposition (EMD).

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Area of Science:

  • Optical Metrology
  • Signal Processing
  • Interferometry

Background:

  • Speckle interferometry (SI) signals are characterized by amplitude and frequency modulation with fluctuating backgrounds.
  • Accurate background intensity elimination is crucial for subsequent phase computation in SI.
  • Existing methods like empirical mode decomposition (EMD) can struggle with background removal in challenging sampling conditions.

Purpose of the Study:

  • To develop a robust and novel method for background intensity elimination in speckle interferometry signals.
  • To accurately determine instantaneous frequency and modulation depth from complex temporal signals.
  • To compare the performance of the new method against empirical mode decomposition (EMD).

Main Methods:

  • Constructing a complex signal from the raw speckle interferometry data.
  • Fitting a circle to the sampled values of the complex signal in the complex plane.
  • Locally adapting the length of the point set used for the circle fit to the signal characteristics.

Main Results:

  • The novel circle fitting method successfully yields background intensity and modulation depth.
  • The method accurately determines the instantaneous frequency of the signal.
  • The approach demonstrates superior robustness compared to EMD, particularly for critically sampled or oversampled signals.

Conclusions:

  • The proposed circle fitting technique offers a significant advancement for background removal in speckle interferometry.
  • This method provides reliable computation of key signal parameters, enhancing the accuracy of SI measurements.
  • The technique is particularly advantageous in scenarios where EMD-based background elimination is prone to errors.