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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: May 26, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

A compact vertical scanner for atomic force microscopes.

Jae Hong Park1, Jaesool Shim, Dong-Yeon Lee

  • 1NEMS and Bio Team, National Nano-fab Center, 335, Gwahangno, Yuseong-gu, Daejeon-si, 305-806, Korea. jhpark@nnfc.re.kr

Sensors (Basel, Switzerland)
|December 14, 2011
PubMed
Summary
This summary is machine-generated.

A new compact vertical scanner for atomic force microscopy (AFM) was developed. This scanner avoids optical interference and demonstrates excellent performance, enabling high-quality AFM imaging.

Keywords:
atomic force microscopeflexure-guidenano-scannernano-sensorpiezoelectric actuator

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Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging
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Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging

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Probing The Structure And Dynamics Of Nucleosomes Using Atomic Force Microscopy Imaging
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Area of Science:

  • Instrumentation
  • Nanotechnology
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) requires precise vertical scanning for high-resolution imaging.
  • Existing AFM scanners can interfere with optical microscopy, hindering cantilever observation.
  • There is a need for compact, non-interfering vertical scanners to improve AFM usability.

Purpose of the Study:

  • To develop a compact vertical scanner for AFM with no optical interference.
  • To theoretically analyze and experimentally validate the scanner's performance characteristics.
  • To demonstrate the scanner's capability by generating an AFM image.

Main Methods:

  • Theoretical derivation of scanner stiffness and resonance.
  • Finite element analysis (FEA) for verification of theoretical models.
  • Experimental evaluation of travel range, resonance frequency, and feedback noise.
  • AFM imaging using the developed vertical scanner.

Main Results:

  • A compact vertical scanner with no interference to the optical microscope was successfully developed.
  • Theoretical and FEA results for stiffness and resonance were verified experimentally.
  • The scanner exhibited a high resonance frequency and low feedback noise, suitable for AFM.

Conclusions:

  • The developed compact vertical scanner is a viable component for AFM systems.
  • Its non-interfering design enhances usability and opens possibilities for integrated optical-AFM systems.
  • The scanner's performance is validated through comprehensive theoretical, simulation, and experimental analyses.