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Related Concept Videos

Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...

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Related Experiment Video

Updated: May 26, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

Compact electron gun based on secondary emission through ionic bombardment.

Babacar Diop1, Jean Bonnet, Thomas Schmid

  • 1Onera-The French Aerospace Lab, F-91761 Palaiseau, France. babacar.diop@onera.fr

Sensors (Basel, Switzerland)
|December 14, 2011
PubMed
Summary

A novel compact electron gun utilizes ionic bombardment for secondary emission, enabling in-flight Electron Beam Fluorescence (EBF) measurements. This technology aids in characterizing atmospheric reentry vehicle flows and upper atmosphere conditions.

Keywords:
07.20.Dt07.57.-c33.50.Dq34.80.Dp34.80.Nz47.40.Ki52.25.Jm52.50.Dg61.80.Fe79.20.Hxdensity measurementselectron beam fluorescenceelectron gunlow density gas flowoptical diagnosticssecondary electronstemperature measurements

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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Related Experiment Videos

Last Updated: May 26, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Area of Science:

  • Plasma physics
  • Aerospace engineering
  • Materials science

Background:

  • Characterizing gas flow around reentry vehicles is crucial for understanding atmospheric interactions.
  • In-flight measurements require compact, robust instrumentation.
  • Electron Beam Fluorescence (EBF) is a valuable diagnostic technique for gas analysis.

Purpose of the Study:

  • To develop a compact electron gun for in-flight EBF measurements.
  • To enable characterization of gas flow (composition, temperature, velocity) around reentry vehicles.
  • To provide a versatile tool for atmospheric and ground-based flow studies.

Main Methods:

  • Design and fabrication of a novel compact electron gun.
  • Principle of operation based on secondary emission via ionic bombardment.
  • Laboratory characterization of the electron gun's features.

Main Results:

  • Successful development of a compact electron gun.
  • Demonstration of the secondary emission through ionic bombardment principle.
  • Characterization of key gun features in a laboratory setting.

Conclusions:

  • The developed electron gun is suitable for in-flight EBF measurements on reentry vehicles.
  • The compact design offers advantages for space-borne and ground-based applications.
  • This technology provides a practical solution for flow characterization in diverse environments.