Compact electron gun based on secondary emission through ionic bombardment

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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Babacar Diop1, Jean Bonnet, Thomas Schmid

  • 1Onera-The French Aerospace Lab, F-91761 Palaiseau, France. babacar.diop@onera.fr

Sensors (Basel, Switzerland)
|December 14, 2011
PubMed

Keywords:
07.20.Dt07.57.-c33.50.Dq34.80.Dp34.80.Nz47.40.Ki52.25.Jm52.50.Dg61.80.Fe79.20.Hxdensity measurementselectron beam fluorescenceelectron gunlow density gas flowoptical diagnosticssecondary electronstemperature measurements

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