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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Susceptibility, Permittivity and Dielectric Constant01:26

Susceptibility, Permittivity and Dielectric Constant

When placed in an external electric field, a dielectric material gets polarized. The charge density in the dielectric material is given by the sum of the bound and free charge densities, while the total charge density can also be written in terms of the total electric field. The bound charge density can be measured in terms of polarization, leading to the relationship between electric displacement and polarization.
Dielectric Polarization in a Capacitor01:31

Dielectric Polarization in a Capacitor

The presence of a dielectric medium in a capacitor not only changes the voltage and capacitance but also affects the electric field. In general, dielectrics can be of two types: polar and nonpolar. In a polar dielectric, the positive and negative charges in the molecules are separated by a distance and hence have a permanent dipole moment. In contrast, no such charge separation exists in a nonpolar dielectric, however the nonpolar molecules get polarized in the presence of an external electric...
Electrostatic Boundary Conditions in Dielectrics01:27

Electrostatic Boundary Conditions in Dielectrics

When an electric field passes from one homogeneous medium to another, crossing the boundary between the two mediums imparts a discontinuity in the electric field. This results in electrostatic boundary conditions that depend on the type of mediums the field propagates through.
Consider a case where both the mediums across a boundary are two different dielectric materials. Recall that the electric field and electric displacement are proportional and related through the material's permittivity.

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Related Experiment Video

Updated: May 26, 2026

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Dielectric constants by multifrequency non-contact atomic force microscopy.

Bharat Kumar1, Joseph C Bonvallet, Scott R Crittenden

  • 1Department of Physics and Astronomy, University of South Carolina, 712 Main Street, Columbia, SC 29208, USA.

Nanotechnology
|December 15, 2011
PubMed
Summary

This study introduces a new atomic force microscopy method to measure dielectric constants of ultra-thin films. The technique accurately determines material properties, crucial for advanced electronic applications.

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

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Last Updated: May 26, 2026

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
10:37

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Accurate characterization of dielectric properties in ultra-thin films is essential for microelectronics and nanotechnology.
  • Existing methods may face limitations in precision or applicability to specific substrates.

Purpose of the Study:

  • To develop and validate a novel multifrequency non-contact atomic force microscopy (NC-AFM) method for determining capacitive forces and dielectric constants.
  • To measure the dielectric constants of self-assembled monolayers on gold and sputtered silicon dioxide (SiO2) films.

Main Methods:

  • Utilizing multifrequency NC-AFM with amplitude feedback in air.
  • Measuring capacitive forces via cantilever oscillations at the second bending mode.
  • Fitting experimental capacitance data to an analytic expression to calculate dielectric constants.

Main Results:

  • Successfully obtained dielectric constants for thiol molecules on gold (2.0±0.1) and sputtered SiO2 (3.6±0.07).
  • Demonstrated good agreement with previously reported measurements under dry conditions.
  • The high Q-factor of the second bending mode enhanced measurement accuracy.

Conclusions:

  • The presented NC-AFM method provides a reliable approach for characterizing dielectric properties of ultra-thin films on metallic substrates.
  • Low applied potentials minimize dielectric constant variation and air breakdown, ensuring data integrity.
  • This technique offers high accuracy and broad applicability in materials characterization.