LEEM and UHV-PEEM: a retrospective.

Area of Science:

• Surface science
• Microscopy techniques
• Materials characterization

Background:

• Low-Energy Electron Microscopy (LEEM) and Photoemission Electron Microscopy (PEEM) are advanced surface imaging techniques.
• Gertrude F. Rempfer has been significantly involved in the development and application of these microscopies, particularly Ultraviolet Photoemission Electron Microscopy (UV-PEEM).

Purpose of the Study:

• To recount the historical evolution of LEEM and PEEM instrumentation.
• To emphasize the parallel development of these techniques with Gertrude F. Rempfer's research contributions.
• To highlight key instrumentation advancements in UV-PEEM and LEEM.

Main Methods:

• Historical review of scientific literature and instrumentation development.
• Focus on the technological progression of LEEM and PEEM systems.
• Examination of specific contributions to UV-PEEM instrumentation.

Main Results:

• Detailed account of instrumentation evolution in LEEM and PEEM.
• Correlation of technological advancements with Gertrude F. Rempfer's research trajectory.
• Identification of key instrumental features enabling UV-PEEM capabilities.

Conclusions:

• The evolution of LEEM and PEEM is intrinsically linked to advancements in instrumentation.
• Gertrude F. Rempfer's work has played a crucial role in the development of UV-PEEM.
• Understanding instrumentation history is key to appreciating the capabilities of modern surface microscopy techniques.