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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
L Pizzagalli1, J Rabier, J Godet
1Institut P', UPR 3346 CNRS/Université de Poitiers, SP2MI, BP 30179, 86962 Futuroscope Chasseneuil Cedex, France.
No abstract available in PubMed .