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Related Concept Videos

Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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Published on: November 30, 2012

Ultrasonic backscattering in polycrystals with elongated single phase and duplex microstructures.

O I Lobkis1, L Yang, J Li

  • 1The Ohio State University, Department of Materials Science and Engineering, Edison Joining Technology Center, 1248 Arthur E. Adams Dr., Columbus, OH 43221, United States.

Ultrasonics
|January 3, 2012
PubMed
Summary
This summary is machine-generated.

This study presents an analytical solution for backscattering in polycrystals with ellipsoidal grains, generalizing previous work. The research highlights interaction length as key for backscattering, outperforming cross-section analysis.

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Scattering And Absorption of Light in Planetary Regoliths

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Area of Science:

  • Materials Science
  • Acoustics
  • Solid Mechanics

Background:

  • Understanding wave propagation and scattering in polycrystals is crucial for material characterization.
  • Existing models often simplify grain geometry, limiting accuracy for complex microstructures.
  • Polycrystals with elongated grains, like those in titanium alloys, present unique scattering challenges.

Purpose of the Study:

  • To develop an analytical solution for the backscattering coefficient in polycrystals with ellipsoidal grains.
  • To investigate the influence of grain geometry and wave propagation direction on backscattering.
  • To introduce and validate new metrics for analyzing microstructural characteristics using backscattering data.

Main Methods:

  • Derivation of a 3D integral representation for the backscattering coefficient.
  • Generalization of existing models for spherical grains to ellipsoidal grain geometries.
  • Application of the developed theory to a simplified titanium alloy duplex microstructure model.
  • Introduction and use of directional backscattering ratios for experimental data analysis.

Main Results:

  • An analytical solution for backscattering in polycrystals with elongated (ellipsoidal) grains was obtained.
  • The averaged interaction length of ellipsoidal grains, not cross-section, was identified as the dominant factor in backscattering.
  • New insights into frequency and grain size dependence of the backscattering signal were revealed.
  • Directional backscattering ratios proved advantageous for characterizing duplex microstructures and microtextures.
  • The non-dimensional material parameter 'q' was introduced, quantifying the contribution of the second phase to backscattering.

Conclusions:

  • The developed analytical solution accurately models backscattering in polycrystals with elongated grains.
  • Interaction length is a more critical parameter than cross-section for backscattering from ellipsoidal grains.
  • Directional backscattering ratios offer a powerful tool for detailed microstructural and microtextural analysis, especially in duplex systems.
  • The new parameter 'q' provides measurable insights into the role of secondary phases in the backscattering process.