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Updated: May 26, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
Ultrasonic backscattering in polycrystals with elongated single phase and duplex microstructures
O I Lobkis1, L Yang, J Li
1The Ohio State University, Department of Materials Science and Engineering, Edison Joining Technology Center, 1248 Arthur E. Adams Dr., Columbus, OH 43221, United States.
Abstract:
An analytical solution for a three dimensional integral representation of the backscattering (BS) coefficient in polycrystals with elongated (generally ellipsoidal) grains is obtained; it is a natural generalization of the known explicit result for the BS coefficient in polycrystals with spherical grains. New insights into the dependence of the BS signal on frequency and averaged ellipsoidal grain radii are obtained. In particular it has been shown that the dominant factor for the backscattering is the averaged interaction length of the ellipsoidal grain in the direction of wave propagation, instead of the ellipsoidal cross-section. The theory was applied to a simplified model of Ti alloy duplex microstructure and was compared with experiment. For the experimental data analysis directional backscattering ratios are introduced and shown to be advantageous for characterization of duplex elongated microstructures/microtextures. In addition to the geometrical parameters of the elongated microtextures, the BS directional ratios depend on the newly introduced nondimensional material parameter q. The parameter q exhibits the relative contribution of the second phase (crystallites) to the backscattering signal, the effect of which is measurable and important. Comparison of the model with experiment shows there is a significant advantage in using the directional ratios of backscattering coefficients for data analysis.
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